EFFECT OF ANNEALING TEMPERATURE ON THE REFRACTIVE INDEX OF TITANIUM DIOXIDE (TIO2) THIN FILMS DEPOSITED BY THERMAL EVAPORATION TECHNIQUE

Document Type : Novel Research Articles

Abstract

Titanium dioxide (TiO2) has attracted much attention in the past decades. TiO2 thin films were prepared using vacuum thermal evaporation technique and then heat treated at different annealing temperatures. An optical characterization method, based only on the transmission spectra at normal incidence of uniform thin films, was used to obtain the refractive index n.   The dispersion of n is discussed in terms of the single-oscillator Wemple and DiDomenico model. The dispersion parameters,  and  decreases after annealing at different temperatures for 3h. The obtained results were discussed in terms of an increasing the packing density of the deposited films after annealing treatment.

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